Hydrogen-induced degradation in NiCuZn ferrite-based multilayer chip inductors

✍ Scribed by W.P. Chen; J.Q. Qi; Y. Wang; X.H. Wang; Z.W. Ma; L.T. Li; H.L.W. Chan

• Book ID: 113788787
• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 257 KB
• Volume: 59
• Category: Article
• ISSN: 0167-577X
• DOI: 10.1016/j.matlet.2005.01.031