"Hump" current dependence upon trapping effects and the relationship to some aspects of the forward-injection failure of GaAs tunnel diodes

✍ Scribed by Holonyak, N., Jr.; Selig, T.; Smith, J.

• Book ID: 117903854
• Publisher: Institute of Electrical and Electronics Engineers
• Year: 1961
• Tongue: English
• Weight: 328 KB
• Volume: 8
• Category: Article
• ISSN: 0096-2430
• DOI: 10.1109/t-ed.1961.14846