Human contamination as a source of IC failures : M. Brenman and J. Mejerovich. Microelectron. J. 20(3), 43 (1989)

• Book ID: 103284869
• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 118 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90445-s