𝔖 Bobbio Scriptorium
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How does noise affect amplitude and latency measurement of event-related potentials (ERPs)? A methodological critique and simulation study

✍ Scribed by Clayson, Peter E.; Baldwin, Scott A.; Larson, Michael J.


Book ID
119879706
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
891 KB
Volume
50
Category
Article
ISSN
0048-5772

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