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Hot-hole-induced negative oxide charges in n-MOSFETs

✍ Scribed by Weber, W.; Brox, M.; Thewes, R.; Saks, N.S.

Book ID: 114536137
Publisher: IEEE
Year: 1995
Tongue: English
Weight: 832 KB
Volume: 42
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.398662

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