Hot-hole-induced interface states build-up on deep-submicrometer LDD nMOSFETs

✍ Scribed by J.M. Rafí; F. Campabadal

• Book ID: 108362439
• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 447 KB
• Volume: 39
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(99)00115-8