✦ LIBER ✦
Hot-electron trapping and generic reliability of p+ polysilicon/SiO2/Si structures for fine-line CMOS technology: L. Manchanda. 24 a. Proc. IEEE Reliab. Phys. Symp., 183 (1986)
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 121 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0026-2714
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