✦ LIBER ✦
Hot electron reliability effects in lateral PNP transistors : D. L. Bergeron, Z. C. Putney, P. H. Smith and G. B. Stephens. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 10
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 121 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0026-2714
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