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Hot-electron microwave noise and power dissipation in AlGaN/AlN/GaN channels for HEMTs

✍ Scribed by A. Matulionis; J. Liberis; M. Ramonas; I. Matulionienė; L. F. Eastman; A. Vertiatchikh; X. Chen; Y.-J. Sun


Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
117 KB
Volume
2
Category
Article
ISSN
1862-6351

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