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Hot-electron effects in Silicon-on-insulator n-channel MOSFET's

✍ Scribed by Colinge, J.-P.

Book ID: 114596102
Publisher: IEEE
Year: 1987
Tongue: English
Weight: 460 KB
Volume: 34
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1987.23213

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