Hot-Electron Capture for CHEI Programming in SONOS-Type Flash Memory Using High- Trapping Layer

✍ Scribed by Gang Zhang; Won Jong Yoo; Chung-Ho Ling

• Book ID: 114619424
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 603 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.922854