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Hot carrier induced interface trap annealing in silicon field effect transistors

✍ Scribed by Das, N. C.; Nathan, V.

Book ID: 119959852
Publisher: American Institute of Physics
Year: 1993
Tongue: English
Weight: 788 KB
Volume: 74
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.354987

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