Hot-carrier-induced interface state generation in submicrometer reoxidized nitrided oxide transistors stressed at 77 K

✍ Scribed by Cable, J.S.; Woo, J.C.S.

• Book ID: 114534737
• Publisher: IEEE
• Year: 1991
• Tongue: English
• Weight: 602 KB
• Volume: 38
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.158683