✦ LIBER ✦
Hot carrier dependent radiation effects: New reliability issue for thin oxide devices
✍ Scribed by N.C. Das; V. Nathan
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 347 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0167-9317
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