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Homogenization of the Thin Dielectric Layers of Wound Components for the Computation of the Parasitic Capacitances in 2-D FE Electrostatics

✍ Scribed by De Greve, Zacharie; Deblecker, Olivier; Lobry, Jacques; Meunier, Gerard

Book ID: 121477575
Publisher: IEEE
Year: 2013
Tongue: English
Weight: 751 KB
Volume: 49
Category: Article
ISSN: 0018-9464
DOI: 10.1109/TMAG.2013.2241038

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