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Holography and plasma oxidation for uniform nanoscale two dimensional channel formation of vertical organic field-effect transistors with suppressed gate leakage current

✍ Scribed by Donghyun Kim; Jaewook Jeong; Hwarim Im; Sungmo Ahn; Heonsu Jeon; Changhee Lee; Yongtaek Hong


Book ID
113834343
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
800 KB
Volume
12
Category
Article
ISSN
1566-1199

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