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Hollow cathode effects in charge development processes in transient hollow cathode discharges

✍ Scribed by Favre, M.; Choi, P.; Chuaqui, H.; Kaufman, Y.; Moreno, J.; Wyndham, E.; Zambra, M.


Book ID
117862516
Publisher
IEEE
Year
1995
Tongue
English
Weight
994 KB
Volume
23
Category
Article
ISSN
0093-3813

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