Hole Traps Produced by High-Temperature Heat Treatments of Silicon Above 1300 °C

✍ Scribed by Kamiura, Y. ;Yoneta, M. ;Hashimoto, F.

• Publisher: John Wiley and Sons
• Year: 1990
• Tongue: English
• Weight: 222 KB
• Volume: 120
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211200129