Hole diffusion length in high purity n-GaAs : R. D. Ryan and J. E. Eberhardt. Solid St. Electron. 15 (1972), p. 865

• Book ID: 103271348
• Publisher: Elsevier Science
• Year: 1973
• Tongue: English
• Weight: 116 KB
• Volume: 12
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(73)90684-7