✦ LIBER ✦
Hole capture cross section and emission coefficient of defect centers related to high-field-induced positive charges in SiO2 layers
✍ Scribed by Xiaoping Gao; Sinclair S Yee
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 482 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0038-1101
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