✦ LIBER ✦

Highly reliable components for the electronics switching system in Japan

✍ Scribed by M. Hanzawa; Y. Hosokawa; A. Tamura; H. Tomita; S. Hiyama

Publisher: Elsevier Science
Year: 1972
Tongue: English
Weight: 173 KB
Volume: 11
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(72)90823-2

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

The Next-Generation Signaling System for

The Next-Generation Signaling System for switching and control in integrated optical networks

✍ Kazem Sohraby; Victor Lawrence; Sukant Mohapatra 📂 Article 📅 2002 🏛 Institute of Electrical and Electronics Engineers 🌐 English ⚖ 132 KB 👁 1 views

Design of highly reliable electronic tra

Design of highly reliable electronic transformer : I. Nishi and A. Takeda. Proceedings of the Second Symposium on Reliability, JUSE, Tokyo, Japan. 17–18 April (1972), p. 131. (In Japanese.)

📂 Article 📅 1972 🏛 Elsevier Science 🌐 English ⚖ 114 KB

A proposal concerned with electronic com

A proposal concerned with electronic component parts field reliability prediction method : T. Nishi. Proceedings of the Second Symposium on Reliability, JUSE, Tokyo, Japan, 17–18 April (1972), p. 441. (In Japanese.)

📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 75 KB

Superexchange electron-transfer reaction

Superexchange electron-transfer reactions in a three-component system. The spin-boson model for photosynthesis

✍ Jau Tang 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 476 KB

The rate expression for the superexchange reaction in a three-component system, involving a donor, a bridging intermediate and a distant acceptor, is derived using the spin-boson model for the primary electron transfer in a photosynthetic reaction center. In this model, a vector spin for SU( 3) grou

Reliability of switching networks for im

Reliability of switching networks for impediment of trunk lines : M. Akiyama and A. Hashimoto. Abstracts Trans. Inst. Electron. Commun. Engrs (Japan)53, No. 10, October (1970), p. 6. (In English)

📂 Article 📅 1971 🏛 Elsevier Science 🌐 English ⚖ 110 KB

Reliability of switching networks for im

Reliability of switching networks for impediment of trunk lines : M. Akiyama and A. Hashimoto, Trans. Inst. Electron. Commun. Engrs Japan 53-A, No. 10, October (1970), p. 540. (In Japanese.)

📂 Article 📅 1971 🏛 Elsevier Science 🌐 English ⚖ 218 KB