Highly Reliable Amorphous Silicon Gate Driver Using Stable Center-Offset Thin-Film Transistors

✍ Scribed by Jae Won Choi; Jae Ik Kim; Se Hwan Kim; Jin Jang

• Book ID: 114620088
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 661 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2054453