Highly effective junction isolation structures for PICs based on standard CMOS Process

✍ Scribed by Starke, T.K.H.; Holland, P.M.; Hussain, S.; Jamal, W.M.; Mawby, P.A.; Igic, P.M.

• Book ID: 114617481
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 544 KB
• Volume: 51
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2004.829895