✦ LIBER ✦
High voltage screening of GaAs power FETs: effect on burn-in yield and modes of catastrophic device failure : A. A. Immorlica, Jr., and J. R. Michener. 23 a. Proc. Reliab. Phys. Symp. 49 (1985)
- Publisher
- Elsevier Science
- Year
- 1986
- Tongue
- English
- Weight
- 96 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0026-2714
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