With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t
β¦ LIBER β¦
High Throughput X-ray Diffraction Analysis of Combinatorial Polycrystalline Thin Film Libraries
β Scribed by Roncallo, Scilla; Karimi, Omeed; Rogers, Keith D.; Gregoire, John M.; Lane, David W.; Scragg, Jonathan J.; Ansari, Salman A.
- Book ID
- 126871159
- Publisher
- American Chemical Society
- Year
- 2010
- Tongue
- English
- Weight
- 919 KB
- Volume
- 82
- Category
- Article
- ISSN
- 0003-2700
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