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High-temperature X-ray diffraction studies of compounds in the M2IO-Ga2O3-TiO2system

✍ Scribed by Knyazev, A. V.; Ladenkov, I. V.; Knyazeva, S. S.

Book ID: 125393501
Publisher: SP MAIK Nauka/Interperiodica
Year: 2014
Tongue: English
Weight: 738 KB
Volume: 59
Category: Article
ISSN: 0036-0236
DOI: 10.1134/S0036023614030115

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