High-temperature slow crack growth of an Yb2O3–SiO2-doped hot-pressed silicon nitride ceramic

✍ Scribed by Shuqi Guo; Naoto Hirosaki; Yoshinobu Yamamoto; Toshiyuki Nishimura; Hidehiko Tanaka

• Book ID: 117357578
• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 538 KB
• Volume: 57
• Category: Article
• ISSN: 0167-577X
• DOI: 10.1016/s0167-577x(03)00044-2