High temperature RF SQUID gradiometer applied to non-destructive testing

✍ Scribed by C.-X. Fan; D.F. Lu; K.W. Wong; Y. Xin; B. Xu; N.S. Alzayed; M. Chester; D.E. Knapp

• Book ID: 107746512
• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 332 KB
• Volume: 34
• Category: Article
• ISSN: 0011-2275
• DOI: 10.1016/0011-2275(94)90145-7