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High temperature phase and morphological changes of CVD-SiC films studied using in situ X-ray diffractometry

โœ Scribed by Toshiki Kingetsu; Kenjiro Ito; Masaharu Takehara


Book ID
117358530
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
790 KB
Volume
36
Category
Article
ISSN
0167-577X

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