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High temperature operation of 760 nm vertical-cavity surface-emitting lasers investigated using photomodulated reflectance wafer measurements and temperature-dependent device studies

✍ Scribed by Cripps, S.A.; Hosea, T.J.C.; Sweeney, S.J.; Lock, D.; Leinonen, T.; Lyytikainen, J.; Dumitrescu, M.


Book ID
114456138
Publisher
The Institution of Electrical Engineers
Year
2005
Tongue
English
Weight
265 KB
Volume
152
Category
Article
ISSN
1350-2433

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