High temperature lifetesting of silicon metal-thin insulator-semiconductor heterojunction emitter bipolar transistors

✍ Scribed by W.L. Guo; M.K. Moravvej-Farshi; M.A. Green

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 414 KB
• Volume: 31
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(88)90407-8