High temperature dielectric loss of h-BN at X band and its dependence on the electron structure, defects and impurities

✍ Scribed by Ting Zhang; Mengqiang Wu; Shuren Zhang; Jinming Wang; Dahai Zhang; Fengmei He; ZhongPing Li

• Book ID: 113914029
• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 384 KB
• Volume: 12
• Category: Article
• ISSN: 1293-2558
• DOI: 10.1016/j.solidstatesciences.2010.07.006