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High-temperature defect structure and electrical conduction in Ni1−xMgxO

✍ Scribed by Seung Chul Choi; Kunihito Koumoto; Hiroaki Yanagida


Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
583 KB
Volume
55
Category
Article
ISSN
0022-4596

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