Abstract
Semi‐finished products and components made of NiTi‐shape‐memory alloys (NiTi‐SMA) are often subjected to heat treatment after their fabrication. During this heat treatment, oxide layers begin to form which contain a high amount of titanium.
In this investigation special attention was drawn to the selective oxidation of Ti because a TiO~X~‐layer can represent a Ni‐barrier and may therefore be of special use for medical applications. A comparison of the following three samples was carried out: A sample oxidised at room temperature, another that was heat‐treated in ambient air (600 °C/1min) and a third sample that was subjected to a heat treatment (600 °C/1min) in an atmosphere that oxidises titanium but reduces NiO in order to achieve a selective oxidation of the titanium. The analysis of the oxide layers was carried out by means of x‐ray photoelectron spectroscopy (XPS). It was shown that the ratio of titanium to nickel in the oxide layer can be substantially increased when performing the annealing treatments in a partial reducing atmosphere.
Furthermore, a thermo‐gravimetric investigation of the material was carried out at 600 °C in dry air in order to estimate the growth of the oxide layers.