✦ LIBER ✦
High temperature annealing of mnos devices and its effect on si-nitride stress, interface charge density and memory properties
✍ Scribed by R. Hezel
- Book ID
- 112812387
- Publisher
- Springer US
- Year
- 1979
- Tongue
- English
- Weight
- 864 KB
- Volume
- 8
- Category
- Article
- ISSN
- 0361-5235
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