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High-speed measurement of three-dimensional surface profiles up to 10 μm using two-wavelength phase-shifting interferometry utilizing an injection locking technique

✍ Scribed by Jang, Roma ;Kang, Chu-Shik ;Kim, Jong-Ahn ;Kim, Jae Wan ;Kim, Jae-Eun ;Park, Hae Yong


Book ID
115356437
Publisher
The Optical Society
Year
2011
Tongue
English
Weight
757 KB
Volume
50
Category
Article
ISSN
1559-128X

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