✦ LIBER ✦
High speed and high accuracy inspection of in-tray laser IC marking using line scan CCD with a new calibration model
✍ Scribed by Chern-Sheng Lin; Jui Tsung Huang; Tzu-Chi Wei; Mau-Shiun Yeh; Der-Chin Chen
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 632 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0030-3992
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