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High-Spatial-Resolution Phase Measurement by Micro-Interferometry Using a Hard X-Ray Imaging Microscope

✍ Scribed by Koyama, Takahisa; Kagoshima, Yasushi; Wada, Izumi; Saikubo, Akihiko; Shimose, Kenichi; Hayashi, Kenji; Tsusaka, Yoshiyuki; Matsui, Junji


Book ID
126699348
Publisher
Institute of Pure and Applied Physics
Year
2004
Tongue
English
Weight
368 KB
Volume
43
Category
Article
ISSN
0021-4922

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