High resolution x-ray study of microstructural changes in semiconductors and insulators subject to high electric fields

✍ Scribed by Krishnan Lal; Peter Thoma

• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 379 KB
• Volume: 40
• Category: Article
• ISSN: 0038-1098
• DOI: 10.1016/0038-1098(81)90592-5