High resolution X-ray diffraction, X-ray multiple diffraction and cathodoluminescence as combined tools for the characterization of substrates for epitaxy: the ZnO case

✍ Scribed by Martínez-Tomás, M. C.; Hortelano, V.; Jiménez, J.; Wang, B.; Muñoz-Sanjosé, V.

• Book ID: 120284366
• Publisher: Royal Society of Chemistry
• Year: 2013
• Tongue: English
• Weight: 889 KB
• Volume: 15
• Category: Article
• ISSN: 1466-8033
• DOI: 10.1039/C3CE27077G