High-resolution X-ray diffraction of molecular-beam-epitaxy-grown InAlAs/InGaAs/InAlAs three-layer structures on (001)-oriented InP substrates

✍ Scribed by Brühl, H.-G. ;Poecker, A. ;Nickel, H. ;Lösch, R. ;Schlapp, W.

• Book ID: 114500741
• Publisher: International Union of Crystallography
• Year: 1993
• Tongue: English
• Weight: 469 KB
• Volume: 26
• Category: Article
• ISSN: 0021-8898
• DOI: 10.1107/s0021889893002390