High-resolution X-ray diffraction investigation of crystal perfection and relaxation of GaAs/InGaAs/GaAs quantum wells depending on MOVPE growth conditions

✍ Scribed by U. Zeimer; F. Bugge; S. Gramlich; I. Urban; A. Oster; M. Weyers

• Publisher: Italian Physical Society
• Year: 1997
• Tongue: English
• Weight: 489 KB
• Volume: 19
• Category: Article
• ISSN: 0392-6737
• DOI: 10.1007/bf03040995