High-resolution work function imaging of single grains of semiconductor surfaces

✍ Scribed by Sadewasser, S.; Glatzel, Th.; Rusu, M.; Jager-Waldau, A.; Lux-Steiner, M. Ch.

• Book ID: 118119147
• Publisher: American Institute of Physics
• Year: 2002
• Tongue: English
• Weight: 394 KB
• Volume: 80
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.1471375