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High-resolution transmission electron microscopy study on SiC grown from SiO and C*: crystal growth and structural characterization

✍ Scribed by M. Benaissa; J. Werckmann; J.L. Hutchison; E. Peschiera; J. Guille; M.J. Ledoux

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 625 KB
Volume: 131
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(93)90390-i

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