High-Resolution Studies of Grain Boundary Structure in Yttria-Stabilized Cubic Zirconia Thin Films Grown by MOCVD

✍ Scribed by Merkle, K. L. ;Bai, G.-R. ;Li, Z. ;Song, C.-Y. ;Thompson, L. J.

• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: English
• Weight: 765 KB
• Volume: 166
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/(sici)1521-396x(199803)166:1<73::aid-pssa73>3.0.co;2-b