High-Resolution Spectroscopy with Reciprocal-Space Analysis: Application to Isotopically Pure Si

✍ Scribed by S.D. Yoo; D.E. Aspnes; L.F. Lastras-Martínez; T. Ruf; M. Konuma; M. Cardona

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 144 KB
• Volume: 220
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/1521-3951(200007)220:1<117::aid-pssb117>3.0.co;2-4