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High-resolution spectroscopy of a cesium-vapor layer with micrometric thickness for the development of frequency reference

✍ Scribed by Todorov, P; Slavov, D; Vaseva, K; Taslakov, M; Cartaleva, S; Saltiel, S


Book ID
111645672
Publisher
Royal Swedish Academy of Sciences
Year
2012
Tongue
English
Weight
194 KB
Volume
t149
Category
Article
ISSN
0031-8949

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