High-Resolution Soft X-ray Photoelectron Spectroscopic Studies and Scanning Auger Microscopy Studies of the Air Oxidation of Alkylated Silicon(111) Surfaces

✍ Scribed by Webb, Lauren J.; Michalak, David J.; Biteen, Julie S.; Brunschwig, Bruce S.; Chan, Ally S. Y.; Knapp, David W.; Meyer, Harry M.; Nemanick, Eric J.; Traub, Matthew C.; Lewis, Nathan S.

• Book ID: 125447807
• Publisher: American Chemical Society
• Year: 2006
• Tongue: English
• Weight: 430 KB
• Volume: 110
• Category: Article
• ISSN: 0022-3654
• DOI: 10.1021/jp063366s