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High resolution seismic refraction method using surface and borehole data for site characterization of rocks

✍ Scribed by Hayashi, K. ;Takahashi, T.

Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 620 KB
Volume: 38
Category: Article
ISSN: 0148-9062
DOI: 10.1016/s1365-1609(01)00045-4

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