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High resolution RTE measurements at 0° using a hemispherical analyser with lens and 2-D PSD

✍ Scribed by E.P. Benis; T.J.M. Zouros; P. Richard

Book ID: 114171107
Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 379 KB
Volume: 154
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(99)00028-2

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